Scanning Electron Microscopy

Our scanning electron microscopes will allow you to view surface features at 10 to 100,000X resolution and provide you with high quality, depth of field images.  Samples are bombarded with electrons in a vacuum chamber producing secondary electrons that are captured and interpreted.  

Bulk chemical analysis with the 30-mm crystal on our digital, energy dispersive x-ray spectrometer (EDS) is more sensitive than common 10-mm light element detectors.  Our superior instrumentation allows us to provide exemplary service at very competitive prices.  

Typical applications of SEM microscopy include:

• Examination of failed semiconductor devices
• Examination of fractured surfaces and deeply etched surfaces
• Examination of prepared samples at high magnification
• Evaluation of crystallographic orientation
• Low cost chemical identification down to micro sized samples such as inclusions, precipitate phases, and wear debris

Analysis by SEM provides a unique depth of field advantage over optical microscopes, allowing the user to focus on irregular fracture surfaces.  When combined with the decades of experience of our operators, the MES E-Beam lab provides a powerful and effective failure analysis technique.    

Our primary electron beam testing instrumentation includes the following instruments:

• JEOL 6100 Scanning Electron Microscope; INCA EDS 
• JEOL 6100 Scanning Electron Microscope; EDAX EDS
• JEOL 5800 Scanning Electron Microscope; Oxford EDS
• JEOL JXA-733 Superprobe with Wavelength Dispersive X-Ray (WDS)
• JEOL JSM-T330A Scanning Electron Microscope; PGT EDS
• JEOL JAMP 10 Scanning Auger Spectrograph
• JEOL JAMP 10S Scanning Auger Spectrograph