Surface Analysis

These analytical techniques provide high magnification characterization and chemistry of metals, ceramics, minerals, polymers, and other materials.  Identification of thin films, inorganic phases, precipitates, and contaminants are also possible with our E-Beam lab.  Elemental dot maps or line scan profiles are produced with either EDS or WDS chemical data collection.  The MES surface analysis department offers high resolution surface examination tools, including:

• Scanning Electron Microscopes (SEM)
• Scanning Auger Microprobes
• Energy Dispersive X-ray Spectrometry (EDX/EDS)
• Chemical analysis using Wavelength Dispersive X-Ray Spectrometry (WDS)
• Real time X-ray

Digital and hard copy micrographs are produced with our high quality image capturing equipment.  These can be emailed, saved on a CD-ROM, or placed on our secure web site for client download.  

Our primary surface analysis testing instrumentation includes the following:

• JEOL JXA-8900 Superprobe with WDS; Oxford EDS
• JEOL 6100 Scanning Electron Microscope; INCA EDS 
• JEOL 6100 Scanning Electron Microscope; Oxford EDS
• JEOL 5800 Scanning Electron Microscope; INCA EDS
• JEOL JXA-733 Superprobe with Wavelength Dispersive X-Ray (WDS)
• JEOL JAMP 10 Scanning Auger Spectrograph
• JEOL JAMP 10S Scanning Auger Spectrograph