Wavelength Dispersive X-Ray

Our surface analysis lab offers quantitative, elemental chemical analysis by Wavelength Dispersive X-Ray Spectrometry (WDS).  This technique is used to provide compositional analysis of steels and other alloys.  WDS can also be used to determine compositional homogeneity and compositional gradients at boundaries.  

WDS is a surface analysis technique that uses an x-ray beam to produce photoelectrons on the surface of a prepared sample.  The beam generally penetrates the outer 50 Angstroms of the sample.  The photoelectrons are separated and interpreted using diffracting crystals.  Quantitative chemical analysis using WDS is achieved by collecting on NIST traceable standards prior to analyzing an unknown composition.  

Our primary electron beam testing instrumentation includes the following:

• JEOL 6100 Scanning Electron Microscope; INCA EDS 
• JEOL 6100 Scanning Electron Microscope; EDAX EDS
• JEOL 5800 Scanning Electron Microscope; Oxford EDS
• JEOL JXA-733 Superprobe with Wavelength Dispersive X-Ray (WDS)
• JEOL JSM-T330A Scanning Electron Microscope; PGT EDS
• JEOL JAMP 10 Scanning Auger Spectrograph
• JEOL JAMP 10S Scanning Auger Spectrograph